Measurement of intensity distribution of an accelerated ion or electron beam in two transverse directions (X and Y). Optional grids are available that permit measurement of additional planes.

Wires to be used for X and Y planes collect charged particles; the collected charge is then converted to a given energy level, which represents beam profile intensity. For particles having a range which is greater than the thickness of harp wires themselves, secondary e1ectrons can be measured. Custom units are available for specific measurements. Configuration of Complete System:

  • Compressed air actuated high vacuum feedthrough (permits harp to move ‘in’ and ‘out’ of the beam path)
  • Harp and frame with adapter (permits unit to be connected to compressed air actuated feedthrough)
  • Signal processing electronics