Application:
Measurement of intensity distribution of an accelerated ion or electron beam in two transverse directions (X and Y). Optional grids are available that permit measurement of additional planes.

Principle: 
Wires to be used for X and Y planes collect charged particles; the collected charge is then converted to a given energy level, which represents beam profile intensity. For particles having a range which is greater than the thickness of harp wires themselves, secondary e1ectrons can be measured. Custom units are available for specific measurements. Configuration of Complete System:

  • Compressed air actuated high vacuum feedthrough (permits harp to move ‘in’ and ‘out’ of the beam path)
  • Harp and frame with adapter (permits unit to be connected to compressed air actuated feedthrough)
  • Signal processing electronics